Rapid scanning delay line for optical coherence tomography based on the thermo-optic effect in silicon
Conference Paper
(2009)
Author(s)
E Margallo (TU Delft - Electronic Instrumentation)
G Pandraud (TU Delft - Electronic Components, Technology and Materials)
P. J. French (TU Delft - Electronic Instrumentation)
Research Group
Electronic Instrumentation
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https://resolver.tudelft.nl/uuid:ed582a3e-3f7f-4140-975f-e1a5e738f2ce
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Publication Year
2009
Research Group
Electronic Instrumentation
Pages (from-to)
501-504
ISBN (print)
978-1-4244-4190-7
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