Structure of thin aluminium-oxide films determined from valence band spectra measured using XPS

Journal article (2002)

Authors

PC Snijders Old - sect Electronic Materials (NS/EM)
LPH Jeurgens OLD Virtual Materials and Mechanics
W.G. Sloof OLD Virtual Materials and Mechanics
Research Group
Old - sect Electronic Materials (NS/EM)
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Published Date

2002

Language

Undefined/Unknown

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Research Group

Old - sect Electronic Materials (NS/EM)