Structure of thin aluminium-oxide films determined from valence band spectra measured using XPS
Journal Article
(2002)
Author(s)
PC Snijders (TU Delft - Old - sect Electronic Materials (NS/EM))
LPH Jeurgens (TU Delft - OLD Virtual Materials and Mechanics)
Willem G. Sloof (TU Delft - OLD Virtual Materials and Mechanics)
Research Group
Old - sect Electronic Materials (NS/EM)
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https://resolver.tudelft.nl/uuid:f73027bf-c06e-4f45-bc3a-f1097f6bb877
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Publication Year
2002
Research Group
Old - sect Electronic Materials (NS/EM)
Volume number
496
Pages (from-to)
97-109
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