Characterization of thermal and high frequency behavior of LDMOS transistors using a pulsed system

Report (1999)

Authors

MP van der Heijden Old - EWI Ch. Integrated Sensing Devices
Research Group
Old - EWI Ch. Integrated Sensing Devices
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Published Date

1999

Language

Undefined/Unknown

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Research Group

Old - EWI Ch. Integrated Sensing Devices