Qualitative techniques for System-on-Chip test with low-energy protons

Abstract

This paper presents an intended test setup and methodology for testing micro-controller SoCs against the effects of ionizing radiations. The method structure is based on a modular test sequence for test definition, coding, validation and setup. It will be illustrated by the relevant example of a microcontroller solution including lockstep options. Our methodology proposes using low-energy protons for irradiation, and this paper compares this approach with current techniques, showing how proton testing is becoming increasingly interesting, especially for ultra-deep submicron processes in proton dominated environments like low-shielded Low Earth Orbit missions or aircraft avionics. Beyond the convenience of a simplified test setup one of the main advantages of the proton irradiation approach is that it can be used for simultaneous Single Event Effects (SEE) and Total Ionizing Dose (TID) characterization, closer to the "test as you fly" approach.