The benefits of statistical experimental design for quantitative electron microscopy

Conference paper (2002)

Authors

S van Aert Old - sect Systems, Signals and control Group (IST/MMR)
A.J. den Dekker Old - sect Systems, Signals and control Group (IST/MMR)
A van den Bos Old - sect Systems, Signals and control Group (IST/MMR)
D Van Dyck External organisation
Research Group
Old - sect Systems, Signals and control Group (IST/MMR)
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Published Date

2002

Language

Undefined/Unknown

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Research Group

Old - sect Systems, Signals and control Group (IST/MMR)