The benefits of statistical experimental design for quantitative electron microscopy
Conference Paper
(2002)
Author(s)
S van Aert (TU Delft - Old - sect Systems, Signals and control Group (IST/MMR))
Arnold J. den Dekker (TU Delft - Old - sect Systems, Signals and control Group (IST/MMR))
A van den Bos (TU Delft - Old - sect Systems, Signals and control Group (IST/MMR))
D Van Dyck (External organisation)
Research Group
Old - sect Systems, Signals and control Group (IST/MMR)
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https://resolver.tudelft.nl/uuid:fbf20aaa-bf7f-4653-80ad-8ee4c7041363
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Publication Year
2002
Research Group
Old - sect Systems, Signals and control Group (IST/MMR)
Bibliographical Note
ISSN 0-620-29294-6@en
Pages (from-to)
189-190
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