Fatigue model based on average cross-section strain of Cu trace cyclic bending

Conference paper (2011)

Authors

D.M. Farley Electronic Components, Technology and Materials - EEMCS
A. Dasgupta External organisation
Y Zhou External organisation
JFJ Caers External organisation
JWC de Vries External organisation
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
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Published Date

2011

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials