Fatigue model based on average cross-section strain of Cu trace cyclic bending
Conference Paper
(2011)
Author(s)
D.M. Farley (TU Delft - Electronic Components, Technology and Materials)
A. Dasgupta (External organisation)
Y Zhou (External organisation)
JFJ Caers (External organisation)
JWC de Vries (External organisation)
Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1109/ESIME.2011.5765858
To reference this document use:
https://resolver.tudelft.nl/uuid:fef73daa-45d2-4b94-a224-47d84d3e8dc0
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Publication Year
2011
Language
English
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
1-10
ISBN (print)
978-1-4577-0107-8
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