An Efficient Analysis Method for Artificial Dielectric Layers With Vertical Metal Inclusions Based on a Full-Wave Spectral-Domain Approach

Abstract

We present an efficient method to analyze a periodic pin-patch structure, consisting of two artificial dielectric layers (ADLs) connected by vertical metal pins. ADLs are made of square metal patches in a periodic lattice and have recently been used as superstrates in antennas and arrays to enhance the bandwidth and scanning range. ADLs form an anisotropic effective medium, thus enabling a large scanning volume without supporting surface waves. However, the anisotropy increases the cross-polarization (X-pol) of the antenna in the diagonal plane. This problem can be reduced by introducing vertical metal pins in the ADL superstrate to form the pin-patch structure. The analysis method is based on a spectral method of moments (MoMs) and uses entire-domain basis functions in a hybrid Cartesian and cylindrical representation to accurately model the currents on the structure and scattering parameters under general plane-wave incidence.