Measurement of the htickness and refractive index of evaporated dielectric films

Doctoral thesis (1968)

Authors

Contributors

H. De Lang (promotor)
Faculty
Applied Sciences (AS) (TU Delft)
Copyright: ©1968 Van Vonno, W.
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Published Date

08-05-1968

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Faculty

Applied Sciences

Files

P1259-5110.pdf
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