Sub-wavelength metrology using Coherent Fourier Scatterometry

Title

Sub-wavelength metrology using Coherent Fourier Scatterometry

 Author

Roy, S.

Contributor

Urbach, H.P. (promotor)

Faculty

Applied Sciences

 Department

ImPhys/Imaging Physics

 Date

2016-03-21

 Abstract

Scattering is the process in which some form of radiation is deviated from its trajectory by a localized non-uniformity it encounters. These non-uniformities, called objects, can be of different material and geometry which determines among many things, mainly, the amount and direction of the scattered radiation. Scatterometry is the branch of science where an accurate estimation of certain properties of the object can be calculated upon measuring this scattered radiation and using some a-priori information about it. In this thesis we present results on designing, developing and testing a special type of optical scatterometric setup to perform metrology of two different kinds of objects: periodic ones (which, in theory, is infinitely extended) and very small isolated ones (which, in theory, can be considered as infinitesimally small).

 Subject

scatterometry
particle detection
critical dimension metrology

 To reference this document use:

https://doi.org/10.4233/uuid:234cb48f-62b3-41e7-bde0-04f0186f52f6

 Embargo date

2016-09-21

 ISBN

978-94-6186-613-4

 Part of collection

Institutional Repository

 Document type

doctoral thesis

 Rights

(c) 2016 Roy, S.
Files
PDF dissertation_sarathi_roy.pdf 11.91 MB
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