Three-terminal electric transport measurements on gold nano-particles combined with ex situ TEM inspection

Journal article (2009)
Department
Kavli Institute of Nanoscience (AS) (TU Delft)
Copyright: ©2009 Gao, B.; Osorio, E.A.; Babaei Gaven, K.; Van der Zant, H.S.J.; Institute of Physics
DOI: https://doi.org/doi:10.1088/0957-4484/20/41/415207
More Info
expand_more

Published Date

30-09-2009

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Source:

Nanotechnology, 20 (41)

ISSN:

0957-4484

Source:

http://iopscience.iop.org/0957-4484/20/41/415207/

Faculty

Applied Sciences

Department

Kavli Institute of Nanoscience

Abstract

We have fabricated nanometer-spaced electrodes on electron-transparent silicon nitride membranes. A thin Cr/Au layer is evaporated on the backside of the membrane which serves as a gate electrode. Using these devices, we have performed three-terminal electron transport measurements on gold nano-particles at liquid helium temperature. Coulomb Blockade features have been observed and the capacitance to the gate has been extracted. After transport measurements, the Cr/Au back gate is removed and the devices are inspected with a transmission-electron microscope (TEM). TEM inspection reveals the presence of a few nano-particles in the nanogap, which is in agreement with the transport measurements. In addition, the nano-particle size as observed by TEM coincides with the one estimated from the gate capacitance value.

Files

Gao.pdf
(pdf | 0.824 Mb)