Print Email Facebook Twitter Superconducting Microstrip Losses at Microwave and Submillimeter Wavelengths Title Superconducting Microstrip Losses at Microwave and Submillimeter Wavelengths Author Hähnle, S.A. (TU Delft Tera-Hertz Sensing; SRON Netherlands Institute for Space Research) Kouwenhoven, K. (TU Delft Tera-Hertz Sensing; SRON Netherlands Institute for Space Research) Buijtendorp, B.T. (TU Delft Tera-Hertz Sensing) Endo, A. (TU Delft Tera-Hertz Sensing; Kavli institute of nanoscience Delft) Karatsu, K. (TU Delft Tera-Hertz Sensing; SRON Netherlands Institute for Space Research) Thoen, David (TU Delft Tera-Hertz Sensing) Murugesan, V. (SRON Netherlands Institute for Space Research) Baselmans, J.J.A. (TU Delft Tera-Hertz Sensing; SRON Netherlands Institute for Space Research) Date 2021 Abstract We present a lab-on-chip experiment to accurately measure losses of superconducting microstrip lines at microwave and submillimeter wavelengths. The microstrips are fabricated from Nb-Ti-N, which is deposited using reactive magnetron sputtering, and amorphous silicon which is deposited using plasma-enhanced chemical vapor deposition (PECVD). Submillimeter wave losses are measured using on-chip Fabry-Perot resonators (FPRs) operating around 350 GHz. Microwave losses are measured using shunted half-wave resonators with an identical geometry and fabricated on the same chip. We measure a loss tangent of the amorphous silicon at single-photon energies of tanδ=3.7±0.5×10-5 at approximately 6GHz and tanδ=2.1±0.1×10-4 at 350 GHz. These results represent very low losses for deposited dielectrics, but the submillimeter wave losses are significantly higher than the microwave losses, which cannot be understood using the standard two-level system loss model. To reference this document use: http://resolver.tudelft.nl/uuid:b6c414da-78d6-4dd6-ad0e-c24415532d5c DOI https://doi.org/10.1103/PhysRevApplied.16.014019 Embargo date 2022-01-08 ISSN 2331-7019 Source Physical Review Applied, 16 (1), 014019-1 - 014019-8 Bibliographical note Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public. Part of collection Institutional Repository Document type journal article Rights © 2021 S.A. Hähnle, K. Kouwenhoven, B.T. Buijtendorp, A. Endo, K. Karatsu, David Thoen, V. Murugesan, J.J.A. Baselmans Files PDF PhysRevApplied.16.014019.pdf 980.33 KB Close viewer /islandora/object/uuid:b6c414da-78d6-4dd6-ad0e-c24415532d5c/datastream/OBJ/view