Reliability and Lifetime Prediction of Remote Phosphor Plates in Solid-State Lighting Applications Using Accelerated Degradation Testing

Journal article (2015)
Department
Microelectronics (EEMCS) (TU Delft)
Copyright: This article is published with open access at Springerlink.com
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Published Date

05-11-2015

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Source:

Journal of Electronic Materials, 2015

Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Abstract

A methodology, based on accelerated degradation testing, is developed to predict the lifetime of remote phosphor plates used in solid-state lighting (SSL) applications. Both thermal stress and light intensity are used to accelerate degradation reaction in remote phosphor plates. A reliability model, based on the Eyring relationship, is also developed in which both acceleration factors (light intensity and temperature) are incorporated. Results show that the developed methodology leads to a significant decay of the luminous flux, correlated colour temperature (CCT) and chromatic properties of phosphor plates within a practically reasonable period of time. The combination of developed acceleration testing and a generalized Eyring equation-based reliability model is a very promising methodology which can be applied in the SSL industry.

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