Print Email Facebook Twitter Generation-recombination noise: The fundamental sensitivity limit for kinetic inductance detectors Title Generation-recombination noise: The fundamental sensitivity limit for kinetic inductance detectors Author De Visser, P.J. Baselmans, J.J.A. Diener, P. Yates, S.J.C. Endo, A. Klapwijk, T.M. Faculty Applied Sciences Department Kavli Institute of NanoScience Date 2012-01-21 Abstract We present measurements of quasiparticle generation-recombination noise in aluminium Microwave Kinetic Inductance Detectors, the fundamental noise source for these detectors. Both the quasiparticle lifetime and the number of quasiparticles can be determined from the noise spectra. The number of quasiparticles saturates to 10 ?m?3 at temperatures below 160 mK, which is shown to limit the quasiparticle lifetime to 4 ms. These numbers lead to a generation-recombination noise limited noise equivalent power (NEP) of 1.5 × 10?19 W/Hz1/2. Since NEP ? Nqp, lowering the number of remnant quasiparticles will be crucial to improve the sensitivity of these detectors. We show that the readout power now limits the number of quasiparticles and thereby the sensitivity. Subject kinetic inductance detectorgeneration-recombination noise To reference this document use: http://resolver.tudelft.nl/uuid:182c820b-1ad9-4ab2-933e-eed24f810e92 DOI https://doi.org/10.1007/s10909-012-0519-5 Publisher Springer ISSN 0022-2291 Source http://www.springerlink.com/content/j43256285t976422/ Source Journal of low temperature physics, 167(Apr)2012 Part of collection Institutional Repository Document type journal article Rights (c)2012 The Author(s). This article is published with open access at Springerlink.com Files PDF 2012-30DeVisser.pdf 386.2 KB Close viewer /islandora/object/uuid:182c820b-1ad9-4ab2-933e-eed24f810e92/datastream/OBJ/view