Functional built-in-test in a pipelined image processor

Functional built-in-test in a pipelined image processor

van Ingen Schenau, H.A.
Pleijsier, A.
Monkel, A.

National Aerospace Laboratory NLR

1984-03-05

A method for built-in-test tBIT) is described which is applied to the test of function modules of a pipelined image processor. The built-in-test is used as a support tool during the early stages of development and for integration and maintenance. The test method takes advantage of the microprocessors used to interface and control the processor modules. Test programs are inserted in the microprocessor software to test the image processor functionally with a similar data and control flow as in real-time operation. The result is a number of test pictures which can be interpreted in relation to the programmed functions of the image processing. Use is made of the 2-dimensional image formats to check the performance of the unit at one glance for several functions and parameter values. Paper presented at the 47th Symposium of the AGARD Avionics Panel on: Design of Tactical Avionics Maintainability, 7-10 May 1984, Brussel, Belgium.

http://resolver.tudelft.nl/uuid:4122ffc8-9926-4a34-bb79-8901bfc27040

Nationaal Lucht- en Ruimtevaartlaboratorium

Campus only

NLR MP 84020 U

Aerospace Engineering Reports

report

(c) 1984 National Aerospace Laboratory NLR