Frequency References Based on the Thermal Diffusivity of Silicon and Silicon Dioxide

Master thesis (2012)

Authors

Contributors

K.A.A. Makinwa (mentor)
Department
Microelectronics & Computer Engineering (EEMCS) (TU Delft)
Copyright: © 2012 Goyal, S.
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Published Date

02-11-2012

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics & Computer Engineering

Abstract

Conventional methods of generating accurate on-chip frequencies are based on electrical components such as resistors, capacitors, and inductors. Recently, a new type of frequency reference based on the thermal diffusivity (TD) of silicon has been introduced. Such TD frequency references rely on the well defined thermal-domain properties of silicon, rather than on the stability of electrical components. This thesis explores various ways of improving the performance of TD frequency references.

Files

Thesis.pdf
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