Print Email Facebook Twitter Electro-optic detection of subwavelength terahertz spot sizes in the near field of a metal tip Title Electro-optic detection of subwavelength terahertz spot sizes in the near field of a metal tip Author Van der Valk, N.C.J. Planken, P.C.M. Faculty Applied Sciences Department Imaging Science and Technology Date 2002-08-26 Abstract We report on a method to obtain a subwavelength resolution in terahertz time-domain imaging. In our method, a sharp copper tip is used to locally distort and concentrate the THz electric field. The distorted electric field, present mainly in the near field of the tip, is electro-optically measured in an (100) oriented GaP crystal. By raster scanning the tip along the surface of the crystal, we find the smallest THz spot size of 18 ?m for frequencies from 0.1 to 2.5 THz. For our peak frequency of 0.15 THz, this corresponds to a resolution of ?/110. Our setup has the potential to reach a resolution down to a few ?m. Subject electro-optical effectssubmillimetre wave imagingimage resolutiongallium compoundsIII-V semiconductors To reference this document use: http://resolver.tudelft.nl/uuid:eafd3eca-ca90-47f1-b557-a1082a869bc8 DOI https://doi.org/10.1063/1.1503404 Publisher American Institute of Physics ISSN 0003-6951 Source http://link.aip.org/link/APPLAB/v81/i9/p1558/s1 Source Applied Physics Letters, 81 (9), 2002 Part of collection Institutional Repository Document type journal article Rights (c) 2002 The Author(s); American Institute of Physics Files PDF vanderValk_2002.pdf 154.55 KB Close viewer /islandora/object/uuid:eafd3eca-ca90-47f1-b557-a1082a869bc8/datastream/OBJ/view