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Announcing TU Delft Repository replacement
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2 July 2024
TU Delft Repository will be replaced with a fresh user friendly design with monthly new feature releases.
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Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM
Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs
Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level
A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs
Impact of Magnetic Coupling and Density on STT-MRAM Performance
Device-Aware Test: A New Test Approach Towards DPPB Level
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