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Wang, Bin (author), Zio, Enrico (author), Chen, X. (author), Zhu, Hanhua (author), Guo, Yunhua (author), Fan, Shidong (author)
In the dredging industry, the automation and accuracy of the Dredging Perception System (DPS) are vital for operational efficiency and environmental safety. Current DPS implementations face challenges with sensor fault tolerance, leading to system unreliability and increased false alarm rates that can disrupt dredging operations. We propose a...
journal article 2024
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Jiang, Jing (author), Chen, Wei (author), Qian, Yichen (author), Meda, Abdulmelik H. (author), Fan, X. (author), Zhang, Kouchi (author), Fan, J. (author)
Considerable advancements in power semiconductor devices have resulted in such devices being increasingly adopted in applications of energy generation, conversion, and transmission. Hence, we proposed a fan-out panel-level packaging (FOPLP) design for 30-V Si-based metal-oxide-semiconductor field-effect transistor (MOSFET). To achieve...
journal article 2023
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Chen, Wei (author), Jiang, Jing (author), Meda, Abdulmelik H. (author), Ibrahim, Mesfin S. (author), Zhang, Kouchi (author), Fan, J. (author)
SiC MOSFET is mainly characterized by the higher electric breakdown field, higher thermal conductivity, and lower switching loss enabling high breakdown voltage, high-temperature operation, and high switching frequency. However, their performances are considerably limited by the high parasitic inductance and poor heat dissipation capabilities...
journal article 2023
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Zhao, Xiujie (author), Chen, P. (author), Lv, Shanshan (author), He, Zhen (author)
Return of products within the warranty coverage induces additional cost and loss of reputation to manufacturers. It is of practical interest to predict the return rate by experimental means before introducing a product to the market. In this paper, we propose to optimize accelerated reliability tests to achieve the goal within limited time....
journal article 2023
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Zhao, Xiujie (author), Chen, P. (author), Gaudoin, Olivier (author), Doyen, Laurent (author)
This study proposes a framework to analyze accelerated degradation testing (ADT) data in the presence of inspection effects. Motivated by a real dataset from the electric industry, we study two types of effects induced by inspections. After each inspection, the system degradation level instantaneously reduces by a random value. Meanwhile, the...
journal article 2021
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