Fieback, M. (author), Wu, L. (author), Cardoso Medeiros, G. (author), Aziza, Hassen (author), Rao, S (author), Marinissen, Erik Jan (author), Taouil, M. (author), Hamdioui, S. (author) This paper proposes a new test approach that goes beyond cell-aware test, i.e., device-aware test. The approach consists of three steps: defect modeling, fault modeling, and test/DfT development. The defect modeling does not assume that a defect in a device (or a cell) can be modeled electrically as a linear resistor (as the traditional approach...
conference paper 2019
