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van Duin, Ron (author), Slabbekoorn, Marijn (author), Tavasszy, Lorant (author), Quak, H (author)
Cities’ sustainability strategies seem to aim at the reduction of the negative impacts of urban freight transport.In the past decades, many public and private initiatives have struggled to gain broad stakeholder support and thus remain viable. Researchers and practitioners have only recently recognised stakeholder acceptance of urban freight...
journal article 2017
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Slabbekoorn, M. (author)
In order to find a solution for the negative externalities that come along with the urban freight demand due to increasing residents in urban areas a previous thesis of Roger Peters (2012), about the impact of municipal decisions on the city distribution system of Breda, concludes that road pricing together with the availability of an urban...
master thesis 2014
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Slabbekoorn, K. (author)
The rise of the Semantic Web and Linked Open Data has led to a large number of different and heterogeneous datasets and ontologies published on the Web. This kind of heterogeneity of datasets has created a need to interlink them, i.e. to make explicit that two resources of different datasets in fact represent the exact same concept. This is the...
master thesis 2012
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De Klerk, P.R. (author), Bouma, G.G. (author), Slabbekoorn, K. (author)
In Japan, most cell phones have the capability of receiving GPS signals. Besides the cell phone there are many other devices that can keep track of GPS data, including the GPS device made by Sony. If all this GPS data is collected and organized, one could get a good overview of peoples whereabouts. That is why the goal of this project was to...
bachelor thesis 2009
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Smeets, E.M.J. (author), Bijnen, F.C.G. (author), Slabbekoorn, J. (author), Van Zeijl, H.W. (author)
In the MEMS world, increasing attention is being given to 3D devices requiring dual-sided processing. This requires lithography tools that are able to align a wafer to both its back side as front side. Overlay describes how well front and back side layers are positioned with respect to each other. Currently there is no simple and fast method to...
conference paper 2004
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Van Zeijl, H.W. (author), Bijnen, F.G.C. (author), Slabbekoorn, J. (author)
To validate the Front- To Backwafer Alignment (FTBA) calibration and to investigate process related overlay errors, electrical overlay test structures are used that requires FTBA [1]. Anisotropic KOH etch through the wafer is applied to transfer the backwafer pattern to the frontwafer. Consequently, the crystal orientation introduces an overlay...
conference paper 2004
document
Vermolen, F.J. (author), Slabbekoorn, H.M. (author), Van der Zwaag, S. (author)
journal article 1997
document
Nanver, L.K. (author), Goudena, E.J.G. (author), Slabbekoorn, J. (author)
journal article 1996
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