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Zhang, L. (author), Hoogenboom, J.P. (author), Cook, B.J. (author), Kruit, P. (author)
Observing atomic motions as they occur is the dream goal of ultrafast electron microscopy (UEM). Great progress has been made so far thanks to the efforts of many scientists in developing the photoemission sources and beam blankers needed to create short pulses of electrons for the UEM experiments. While details on these setups have typically...
journal article 2019
document
Weppelman, I.G.C. (author), Moerland, R.J. (author), Zhang, L (author), Kieft, E. (author), Kruit, P. (author), Hoogenboom, J.P. (author)
Crucial for the field of ultrafast electron microscopy is the creation of sub-picosecond, high brightness electron pulses. The use of a blanker to chop the beam that originates from a high brightness Schottky source may provide an attractive alternative to direct pulsed laser illumination of the source. We have recently presented the concept...
journal article 2019