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Zhao, Xiujie (author), Chen, P. (author), Gaudoin, Olivier (author), Doyen, Laurent (author)This study proposes a framework to analyze accelerated degradation testing (ADT) data in the presence of inspection effects. Motivated by a real dataset from the electric industry, we study two types of effects induced by inspections. After each inspection, the system degradation level instantaneously reduces by a random value. Meanwhile, the...journal article 2021
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Hu, Jiawen (author), Chen, P. (author)The remaining useful lifetime (RUL) estimated from the in-situ degradation data has shown to be useful for online predictive maintenance. In the literature, the RUL is often estimated by assuming a soft-failure threshold for the degradation data. In practice, however, systems may not be subject to the degradation-induced soft failures....journal article 2020