Method for removing a high definition nanostructure, a partly freestanding layer, a sensor comprising said layer and a method using said sensor

The present invention is in the field of a method for removing a high definition nanostructure in a partly free-standing layer, the layer, a sensor comprising said layer, a use of said sensor, and a method of detecting a species, and optional further characteristics thereof, using said sensor. The sensor and method are suited for detecting...

Atomic-scale electron-beam sculpting of defect-free graphene nanostructures

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.