Searched for: collection%253Air
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Petrik, P. (author), Fodor, B. (author), Agocs, E. (author), Kozma, P. (author), Nador, J. (author), Kumar, N. (author), Endres, J. (author), Juhasz, G. (author), Major, C. (author), Pereira, S.F. (author), Lohner, T. (author), Urbach, H.P. (author), Bodermann, B. (author), Fried, M. (author)
conference paper 2015
document
Konijnenberg, A.P. (author), Wei, L. (author), Kumar, N. (author), Couto Correa Pinto Filho, L. (author), Cisotto, L. (author), Pereira, S.F. (author), Urbach, H.P. (author)
In several optical systems, a specific Point Spread Function (PSF) needs to be generated. This can be achieved by shaping the complex field at the pupil. The Extended Nijboer-Zernike (ENZ) theory relates complex Zernike modes on the pupil directly to functions in the focal region. In this paper, we introduce a method to engineer a PSF using the...
journal article 2014
document
El Gawhary, O. (author), Wiegmann, A. (author), Kumar, N. (author), Pereira, S.F. (author), Urbach, H.P. (author)
Through-focus phase retrieval methods aim to retrieve the phase of an optical field from its intensity distribution measured at different planes in the focal region. By using the concept of spatial correlation for propagating fields, for both the complex amplitude and the intensity of a field, we can infer which planes are suitable to retrieve...
journal article 2013
document
Roy, S. (author), Kumar, N. (author), Pereira, S.F. (author), Urbach, Paul (author)
journal article 2013
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Pereira, S.F. (author), Wiegman, A. (author), Kumar, N. (author), Da Costa Assafrao, A. (author), Polo, A. (author), Wei, L. (author), Van Haver, S. (author)
Measurement techniques to determine the aberration of an optical system, by obtaining through-focus intensity images that are produced when the object is a point source at infinity, are shown. The analysis of the aberrations is made using the extended version of the Nijboer-Zernike diffraction theory. This theory provides a semi analytical...
conference paper 2012
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El Gawhary, O. (author), Kumar, N. (author), Pereira, S.F. (author), Coene, W.M.J. (author), Urbach, H.P. (author)
Scatterometry is a well established technique currently utilized in research, as well as in industrial applications, to retrieve the properties of a given scatterer (the target) by looking at how the light coming from a certain source is diffracted in the far field. Currently the light source is often a discharge lamp that, after wavelength...
journal article 2011
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