Towards Tm²⁺ in sialon thin films grown by sputtering using the gradient deposition

The valence stability parameter (E_Ff), defined as the difference between the charge transfer energy to the host intrinsic Fermi energy, was used as criterion to analyze the capability of different host materials within the SiAlON class to stabilize divalent thulium. Available data on charge transfer energies and optical bandgap...