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De Rooi, J.J. (author), Van der Pers, N.M. (author), Hendrikx, R.W.A. (author), Delhez, R. (author), Bottger, A.J. (author), Eilers, P.H.C. (author)X-ray diffraction scans consist of series of counts; these numbers obey Poisson distributions with varying expected values. These scans are often smoothed and the K2 component is removed. This article proposes a framework in which both issues are treated. Penalized likelihood estimation is used to smooth the data. The penalty combines the...journal article 2014
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Van der Pers, N.M. (author), Hendrikx, R.W.A. (author), Delhez, R. (author), Böttger, A.J. (author)A new diffracted-beam monochromator has been developed for Bragg-Brentano X-ray diffractometers equipped with a linear detector. The monochromator consists of a cone-shaped graphite highly oriented pyrolytic graphite crystal oriented out of the equatorial plane such that the parafocusing geometry is preserved over the whole opening angle of the...journal article 2013
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- Bottger, A. (author), Delhez, R. (author), Hendrikx, R.W.A. (author), Pers, N.M. (author) patent 2012