Online Fault Detection and Diagnosis in RRAM

Resistive Random Access Memory (RRAM, or ReRAM) is a promising memory technology to replace Flash because of its low power consumption, high storage density, and simple integration in existing IC production processes. This has motivated many companies to invest in this technology. However, RRAM manufacturing introduces new failure mechanisms and...

Performance Analysis of the Wind Field Estimation for a Very Fast Scanning Weather Radar

The performance and limitations of the Doppler processing of the scattered signals from extended meteorological objects (precipitation) are analysed in the case of radar with fast azimuthal scanning. The classical method of the Discrete Fourier Transform (DFT) has been applied to simulated weather radar signals to estimate the Doppler velocity...

Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs

Manufacturing defects in FinFET SRAMs can cause hard-to-detect faults such as Random Read Faults (RRFs). Detection of RRFs is not trivial, as they may not lead to incorrect outputs. Undetected RRFs become test escapes, which might lead to no-trouble-found devices and early in-field failures. Therefore, the detection of RRFs is of utmost...

Improving the Detection of Undefined State Faults in FinFET SRAMs

Manufacturing defects in FinFET SRAMs can cause hard-to-detect faults such as Undefined State Faults (USFs). Detection of USFs is not trivial, as they may not lead to incorrect functionality. Nevertheless, undetected USFs may have a severe impact on the memory's quality: they can cause random read outputs, which might lead to test escapes and no...

DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs

Hard-to-detect faults such as weak and random faults in FinFET SRAMs represent an important challenge for manufacturing testing in scaled technologies, as they may lead to test escapes. This paper proposes a Design-for-Testability (DFT) scheme able to detect such faults by monitoring the bitline swing of FinFET memories. Using only five...