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Herzog, Alexander (author), Wagner, Max (author), Benkner, Simon (author), Zandi, Babak (author), van Driel, W.D. (author), Khanh, Tran Quoc (author)We report on the degradation dynamics and mechanisms of the commercially available chip-on-board (COB) high-power light-emitting diode (LED) modules with an electrical power of 175 W. Due to the associated thermal load, the temperature dependence of the aging processes is additionally analyzed within the scope of this work. The aging tests...journal article 2022
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Zheng, X.X. (author), Bottger, A.J. (author), Jansen, K.M.B. (author), van Turnhout, J. (author), van Kranendonk, J (author)Alkaline water electrolysis becomes increasingly important for the supply of renewable energy, and of raw material for the chemical industry. An attractive choice for the encapsulation of the electrolyte cell is an (advanced) engineering polymer. The objective of this paper is to find a suitable one that can withstand for many years: 30 wt% KOH...journal article 2020
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Qian, Cheng (author), Fan, Jiajie (author), Fang, Jiayi (author), Yu, Chaohua (author), Ren, Y. (author), Fan, Xuejun (author), Zhang, Kouchi (author)By solving the problem of very long test time on reliability qualification for Light-emitting Diode (LED) products, the accelerated degradation test with a thermal overstress at a proper range is regarded as a promising and effective approach. For a comprehensive survey of the application of step-stress accelerated degradation test (SSADT) in...journal article 2017