Searched for: subject%3A%22Calibration%22
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Pourmousavian, Naser (author), Kuo, Feng Wei (author), Siriburanon, Teerachot (author), Babaie, M. (author), Staszewski, R.B. (author)
This paper proposes an ultra-low-voltage (ULV) fractional-N all-digital PLL (ADPLL) powered from a single 0.5-V supply. While its digitally controlled oscillator (DCO) runs directly at 0.5 V, an internal switched-capacitor dc-dc converter ``doubles'' the supply voltage to all the digital circuitry and particularly regulates the time-to...
journal article 2018
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Chen, Peng (author), Huang, Xiongchuan (author), Chen, Y. (author), Wu, Lianbo (author), Staszewski, R.B. (author)
To characterize an on-chip programmable delay in a low-cost and high-resolution manner, a built-in self-test based on a first-order ΔΣ time-to-digital converter with self-calibration is proposed and implemented in TSMC 28-nm CMOS. The system is self-contained, and only one digital clock is needed for the measurements. A...
journal article 2018
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Akter, S. (author), Sehgal, R.K. (author), van der Goes, Frank (author), Makinwa, K.A.A. (author), Bult, K. (author)
This paper presents a closed-loop class-AB residue amplifier for pipelined analog-to-digital converters (ADCs). It consists of a push-pull structure with a ``split-capacitor'' biasing circuit that enhances its power efficiency. The amplifier is inherently quite linear, and so incomplete settling can be used to save power while still...
journal article 2018