Proceedings of SPIE: Wavelength-resolved Purcell enhancement of PbS/CdS quantum dots measured on a chip-based platform

Future quantum optical networks will require an integrated solution to multiplex suitable sources and detectors on a low-loss platform. Here we combined superconducting single-photon detectors with colloidal PbS/CdS quantum dots (QDs) and low-loss silicon nitride passive photonic components to show their combined operation at cryogenic...

Experimental techniques for aberration retrieval with through-focus intensity images

Measurement techniques to determine the aberration of an optical system, by obtaining through-focus intensity images that are produced when the object is a point source at infinity, are shown. The analysis of the aberrations is made using the extended version of the Nijboer-Zernike diffraction theory. This theory provides a semi analytical...

Enabling aberration retrieval of microlenses with the Extended Nijboer-Zernike (ENZ) diffraction theory

We propose a measurement approach that allows the determination of aberrations of a microlens by analyzing the through-focus intensity image it produces when the object is a point source. To simulate image formation by a microlens we apply the extended version of the Nijboer-Zernike diffraction theory (ENZ) that uses the Debye diffraction...