Searched for: subject%3A%22Integrated%22
(1 - 2 of 2)
document
Pereira, S.F. (author), Wiegman, A. (author), Kumar, N. (author), Da Costa Assafrao, A. (author), Polo, A. (author), Wei, L. (author), Van Haver, S. (author)
Measurement techniques to determine the aberration of an optical system, by obtaining through-focus intensity images that are produced when the object is a point source at infinity, are shown. The analysis of the aberrations is made using the extended version of the Nijboer-Zernike diffraction theory. This theory provides a semi analytical...
conference paper 2012
document
Van Haver, S. (author), Braat, J.J.M. (author), Pereira, S.F. (author)
We propose a measurement approach that allows the determination of aberrations of a microlens by analyzing the through-focus intensity image it produces when the object is a point source. To simulate image formation by a microlens we apply the extended version of the Nijboer-Zernike diffraction theory (ENZ) that uses the Debye diffraction...
conference paper 2010