Temperature dependent trap characterisation and modelling of silicon carbide MOS capacitor

Due to the deficient passivation of the interface between silicon carbide and silicon dioxide, the defect-induced capture and release of trapped charges triggered by external Bias Temperature Stress (BTS) leads to parameter shifts and degraded device performance. This study models the trap-induced transient current in silicon carbide metal-oxide...

Lifetime Prediction of Current-and Temperature-Induced Degradation in Silicone-Encapsulated 365 nm High-Power Light-Emitting Diodes

We report on the degradation mechanisms and dynamics of silicone encapsulated ultraviolet A (UV-A) high-power light-emitting diodes (LEDs), with a peak wavelength of 365nm. The stress tests were carried out for a period of 8665 hours with forward currents between 350mA and 700mA and junction temperatures up to 132°C. Depending on stress...

Silicon carbide-on-insulator thermal-piezoresistive resonator for harsh environment application

The thermal-piezoresistive effect in silicon (Si) has attracted great attention toward high-performance resonant devices but still faces major challenges for harsh environment applications. Instead of using Si, this paper, for the first time, reports a thermal-piezoresistive resonator based on a silicon carbide-on-insulator (SiCOI) platform. The...

Design of a surface inspection tool for rapid detection of micrometer-sized water droplets on a silicon wafer

In this design study a new design is proposed for an in situ surface inspection tool that can rapidly detect micrometer sized water droplets on a silicon wafer. This surface inspection tool is part of a proposed redesign of the thermal conditioning stage of VDL-ETGs atmospheric wafer handler. A meticulous requirements study was performed, and...

Exploring water and ion transport process at silicone/copper interfaces using in-situ electrochemical and Kelvin probe approaches

In general, packaging materials which encapsulate light emitting diodes (LEDs) and microelectronic devices offer barrier protection against several environmental hazards such as water and ionic contaminants. However, these encapsulants may provide pathways for water and ionic contaminants to reach the metal/polymer interfaces and provoke local...

The influence of phosphor particles on the water transport in optical silicones for LEDs

The reliability of LEDs decreases in moist environments. One potential gateway of moisture ingress, reducing the product lifetime is the lens. In white LEDs, phosphor particles are embedded into the optical silicone of the lens to convert the blue light emitted by the diode down in frequency and achieve a light output that appears white. In this...

Study on the Degradation of Optical Silicone Exposed to Harsh Environments

Degradation mechanisms of silicone plates under harsh environment conditions are studied in this investigation. Environmental degradation of silicone free form, used as secondary optics in Light Emitting Diode LED lighting lamps and luminaires or any other applications requiring high quality optics being used, has negative implications for the...