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Announcing TU Delft Repository replacement
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2 July 2024
TU Delft Repository will be replaced with a fresh user friendly design with monthly new feature releases.
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Searched for: subject%3A%22Silicon%22
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A Chip Integrity Monitor for Evaluating Moisture/Ion Ingress in mm-Sized Single-Chip Implants
Measuring plastic deformation of silicon as a result of thermal oxidation
Effects of Silicon Oxides as Substrates for Graphene Gas Sensor
Electron-beam-induced deposition of platinum at low landing energies
Searched for: subject%3A%22Silicon%22
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