Searched for: subject%3A%22Testability%22
(1 - 11 of 11)
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Alfrink, Kars (author), Keller, A.I. (author), Doorn, N. (author), Kortuem, G.W. (author)
Local governments increasingly use artificial intelligence (AI) for automated decision-making. Contestability, making systems responsive to dispute, is a way to ensure they respect human rights to autonomy and dignity. We investigate the design of public urban AI systems for contestability through the example of camera cars: human-driven...
conference paper 2023
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Xun, H. (author), Fieback, M. (author), Yuan, S. (author), Aziza, Hassen (author), Heidekamp, Mathijs (author), Copetti, Thiago (author), Poehls, Leticia Bolzani (author), Taouil, M. (author), Hamdioui, S. (author)
Resistive Random Access Memories (RRAMs) are being commercialized with significant investment from several semiconductor companies. In order to provide efficient and high-quality test solutions to push high-volume production, a comprehensive understanding of manufacturing defects is significantly required. This paper identifies and characterizes...
conference paper 2023
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Xun, H. (author), Yuan, S. (author), Fieback, M. (author), Taouil, M. (author), Hamdioui, S. (author), Aziza, Hassen (author)
Many companies are heavily investing in the commercialization of Resistive Random Access Memories (RRAMs). This calls for a comprehensive understanding of manufacturing defects to develop efficient and high-quality test and diagnosis solutions to push high-volume production. This paper identifies and characterizes a new defect based on silicon...
conference paper 2023
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Cardoso Medeiros, G. (author)
The Fin Field-Effect Transistor (FinFET) technology became the most promising approach to enable the downscaling of technological nodes below the 20 nm threshold. However, the introduction of new technology nodes for embedded memories such as SRAMs, especially for even smaller nodes such as 10 and 5 nm, gives rise to new manufacturing failure...
doctoral thesis 2022
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Singh, A. (author), Fieback, M. (author), Bishnoi, R.K. (author), Bradarić, Filip (author), Gebregiorgis, A.B. (author), Joshi, R.V. (author), Hamdioui, S. (author)
Emerging non-volatile resistive RAM (RRAM) device technology has shown great potential to cultivate not only high-density memory storage, but also energy-efficient computing units. However, the unique challenges related to RRAM fabrication process render the traditional memory testing solutions inefficient and inadequate for high product quality...
conference paper 2022
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Zhu, Q. (author), Zaidman, A.E. (author), Panichella, A. (author)
Mutation testing is well-known for its efficacy in assessing test quality, and starting to be applied in the industry. However, what should a developer do when confronted with a low mutation score? Should the test suite be plainly reinforced to increase the mutation score, or should the production code be improved as well, to make the...
journal article 2021
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Du Bois, E. (author), Horvath, I. (author)
The research is situated in the system development phase of interactive software products. In this detailed design phase, we found a need for fast testable prototyping to achieve qualitative change proposals on the system design. In this paper, we discuss a literature study on current software development and opportunities for building fast...
conference paper 2014
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Haron, N.Z.B. (author)
Emerging nanoelectronic memories such as Resistive Random Access Memories (RRAMs) are possible candidates to replace the conventional memory technologies such as SRAMs, DRAMs and flash memories in future computer systems. Despite their advantages such as enormous storage capacity, low-power per unit device and reduced manufacturing difficulties,...
doctoral thesis 2012
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Gonzales-Sanchez, A. (author), Piel, E.A.B. (author), Gross, H.G. (author), Van Gemund, A.J.C. (author)
Runtime testing is emerging as the solution for the integration and assessment of highly dynamic, high availability software systems where traditional development-time integration testing cannot be performed. A prerequisite for runtime testing is the knowledge about to which extent the system can be tested safely while it is operational, i.e.,...
journal article 2011
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Eliezer, O. (author), Staszewski, R.B. (author)
Digital RF solutions have been shown to be advantageous in various design aspects, such as accurate modeling, design reuse, and scaling when migrating to the next CMOS process node. Consequently, the majority of new low-cost and feature cell phones are now based on this approach. However, another equally important aspect of this approach to...
journal article 2011
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Gonzalez, A. (author), Piel, E. (author), Gross, H.G. (author), Van Gemund, A.J.C. (author)
Runtime testing is emerging as the solution for the integration and assessment of highly dynamic, high availability software systems where traditional development-time integration testing cannot be performed. A prerequisite for runtime testing is the knowledge about to which extent the system can be tested safely while it is operational, i.e.,...
report 2010
Searched for: subject%3A%22Testability%22
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