Test and Diagnosis of Hard-to-Detect Faults in FinFET SRAMs

The Fin Field-Effect Transistor (FinFET) technology became the most promising approach to enable the downscaling of technological nodes below the 20 nm threshold. However, the introduction of new technology nodes for embedded memories such as SRAMs, especially for even smaller nodes such as 10 and 5 nm, gives rise to new manufacturing failure...

Hierarchical Memory Diagnosis Approach

Semiconductor memories are an inherent part of many modern electronic systems. Due to the fast development of memory process technology and the escalating computing speeds, the on-chip share of memories is rapidly increasing. Additionally, the quality and reliability requirements are becoming more severe especially for critical applications such...