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Khalili Amiri, P.K. (author), Rejaei, B. (author), Vroubel, M. (author), Zhuang, Y. (author)The authors report on the observation of nonreciprocal spin wave propagation in a thin ( ? 200?nm) patterned Ni–Fe stripe. The spin wave transmission spectrum is measured using a pair of microstrip lines as antennas. The nonreciprocity of surface wave dispersion brought about by an adjacent aluminum ground leads to a nonreciprocal coupling of...journal article 2007
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Molinari, A. (author), Gutiérrez, I. (author), Hulea, I.N. (author), Russo, S. (author), Morpurgo, A.F. (author)The authors report a systematic study of the bias-dependent contact resistance in rubrene single-crystal field-effect transistors with Ni, Co, Cu, Au, and Pt electrodes. They show that the reproducibility in the values of contact resistance strongly depends on the metal, ranging from a factor of 2 for Ni to more than three orders of magnitude...journal article 2007
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Deachapunya, S. (author), Stefanov, A. (author), Berninger, M. (author), Ulbricht, H. (author), Reiger, E. (author), Doltsinis, N.L. (author), Arndt, M. (author)The authors present new measurements of thermal and electrical properties for two porphyrin derivatives. They determine their sublimation enthalpy from the temperature dependence of the effusive beam intensity. The authors study H2TPP and Fe(TPP)Cl in matter-wave interferometry. Both molecules have nearly equal de Broglie wavelengths but...journal article 2007
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Sellier, H. (author), Lansbergen, G.P. (author), Caro, J. (author), Rogge, S. (author), Collaert, N. (author), Ferain, I. (author), Jurczak, M. (author), Biesemans, S. (author)The authors investigate the subthreshold behavior of triple-gate silicon field-effect transistors by low-temperature transport experiments. These three-dimensional nanoscale devices consist of a lithographically defined silicon nanowire surrounded by a gate with an active region as small as a few tens of nanometers down to 50×60×35?nm3....journal article 2007
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Durkut, M. (author), Mas-Torrent, M. (author), Hadley, P. (author), Jonkheijm, P. (author), Schenning, A.P.H.J. (author), Meijer, E.W. (author), George, S. (author), Ajayaghosh, A. (author)The electrical properties of supermolecular assemblies of oligo(p-phenylene vinylene) were studied. These materials self-assemble into well-defined cylindrical structures in solution with lengths in the range of 100?nm–10??m and diameters between 5 and 200?nm. Atomic force microscopy showed that by adjusting the concentration, either individual...journal article 2006
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Pedarnig, J.D. (author), Rössler, R. (author), Delamare, M.P. (author), Lang, W. (author), Bäuerle, D. (author), Köhler, A. (author), Zandbergen, H.W. (author)Vicinal YBa2Cu3O7?? (YBCO) thin films of thickness h = 20–480?nm are grown by pulsed-laser deposition on 10° miscut (001) SrTiO3 substrates. The anisotropic resistivities, c-axis texture, and critical temperature drastically depend on the thickness of vicinal films. High-resolution electron microscopy reveals a defect microstructure with strong...journal article 2002
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- Tans, S.J. (author), Devoret, M.H. (author), Dai, H. (author), Thess, A. (author), Smalley, R.E. (author), Georliga, L.J. (author), Dekker, C. (author) journal article 1997
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- Jak, M.J.G. (author), Kelder, E.M. (author), Stuivinga, M. (author), Schoonman, J. (author), Chowdari, B.V.R. (author) journal article 1996
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- Jak, M.J.G. (author), Kelder, E.M. (author), Van Zomeren, R.A. (author), Schoonman, J. (author) conference paper 1996
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- Ivanov, S.A.K. (author), Schoonman, J. (author) journal article 1996
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- Huang, X.J. (author), Schoonman, J. (author), Chen, L.Q. (author) journal article 1994
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- Chen, L. (author), Schoonman, J. (author) journal article 1993
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- Kosacki, I. (author), Becht, J.G.M. (author), Van Landschoot, R. (author), Schoonman, J. (author) journal article 1993
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- Rao, N. (author), Schoonman, J. (author), Sorensen, O.T. (author) journal article 1992
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- Vischjager, D.J. (author), Van der Put, P.J. (author), Schram, J. (author), Schoonman, J. (author) journal article 1988
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