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Zhang, L. (author), Garming, M.W.H. (author), Hoogenboom, J.P. (author), Kruit, P. (author)Electrostatic beam blankers are an alternative to photo-emission sources for generating pulsed electron beams for Time-resolved Cathodoluminescence and Ultrafast Electron Microscopy. While the properties of beam blankers have been extensively investigated in the past for applications in lithography, characteristics such as the influence of...journal article 2020
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Yin, L.J. (author), Dierre, B.F.P.R. (author), Sekiguchi, Takashi (author), van Ommen, J.R. (author), Hintzen, H.T.J.M. (author), Cho, Yujin (author)To modify the luminescence properties of Ce<sup>3+</sup>-doped Y<sub>3</sub>Al<sub>5</sub>O<sub>12</sub> (YAG) phosphors, they have been coated with a carbon layer by chemical vapor deposition and subsequently heat-treated at high temperature under N<sub>2</sub> atmosphere. Luminescence of the carbon coated YAG:Ce<sup>3+</sup> phosphors has...journal article 2017
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Moerland, R.J. (author), Weppelman, I.G.C. (author), Garming, M.W.H. (author), Kruit, P. (author), Hoogenboom, J.P. (author)We show cathodoluminescence-based time-resolved electron beam spectroscopy in order to directly probe the spontaneous emission decay rate that is modified by the local density of states in a nanoscale environment. In contrast to dedicated laser-triggered electron-microscopy setups, we use commercial hardware in a standard SEM, which allows us to...journal article 2016