Searched for: subject%3A%22resistance%22
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document
Sewlikar, Parth (author)
For the past few decades, the aerospace industry has been actively looking for measures to tackle the problem of localized corrosion of aluminium alloy 2024-T3. One such measure was the use of hexavalent chromium salts as corrosion inhibitors. However, recent studies have reflected the environmental concerns and health impacts associated with...
master thesis 2022
document
Harry, K.J. (author), Strobel, S.. (author), Yang, J.K.W. (author), Duan, H. (author), Berggren, K.K. (author)
In order to better characterize the development of the electron-beam resist hydrogen silsesquioxane (HSQ), the authors used a quartz crystal microbalance (QCM) to study its rate of dissolution in situ. The authors determined the effect of both salt concentration and applied electric potential on the development rate of HSQ. The development rates...
journal article 2011
document
Sidorkin, V. (author), Van Veldhoven, E. (author), Van der Drift, E.W.J.M. (author), Alkemade, P.F.A. (author), Salemink, H. (author), Maas, D. (author)
Scanning helium ion beam lithography is presented as a promising pattern definition technique for dense sub-10-nm structures. The powerful performance in terms of high resolution, high sensitivity, and a low proximity effect is demonstrated in a hydrogen silsesquioxane resist.
journal article 2009
document
Sidorkin, V. (author), Van der Drift, E.W.J.M. (author), Salemink, H. (author)
Performance of hydrogen silsesquioxane (HSQ) resist material with respect to the temperature during electron beam exposure was investigated. Electron beam exposure at elevated temperatures up to 90?°C shows sensitivity rise and slight contrast (?) degradation compared to lower temperature cases. Ultrahigh resolution structures formed at elevated...
journal article 2008
document
Tans, S.J. (author), Miedema, R. (author), Geerligs, L.J. (author), Dekker, C. (author), Wu, J. (author), Wegner, G. (author)
journal article 1997
Searched for: subject%3A%22resistance%22
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