Automated spherical aberration correction in scanning confocal microscopy

Mismatch between the refractive indexes of immersion media and glass coverslips introduces spherical aberrations in microscopes especially for high numerical aperture objectives. This contribution demonstrates an automated adjustment of the coverslip correction collar in scanning confocal microscopy to compensate for spherical aberrations due to...

Low-energy electron beams through ultra-thin foils, applications for electron microscopy

This thesis has discussed two electron microscopy applications that make use of ultra-thin foils: the tunnel junction emitter and the low-energy foil corrector. Both applications have in common that the electron beam is sent through the thin foil at low energy. Part of the electrons will scatter in the foil, thus causing a reduction of the...

Saddle points in the merit function landscape of systems of thin lenses in contact

The merit function landscape of systems of thin lenses in contact, which are perhaps the simplest possible types of optical systems, shows remarkable regularities. It is easier to understand how the optimization parameter space of these simple systems is divided into basins of attraction for the various local minima if one focuses on the (Morse...