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The continuous transistor scaling and extremely lower power constraints in modern VLSI chips can potentially supersede the benefits of the technology shrinking due to reliability issues. Due to external aggression factors, e.g., radiation and temperature gradients, the CMOS devic
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With the continuous scaling of CMOS VLSI technology well into the nano-meter regime, and the increasing demand for ultra low power/low voltage circuits and systems, reliability is becoming an extra design optimisation goal in addition to
size, performance, and energy. In this pap
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