In this research a novel generic local adaptive measurement procedure for low noise single and sequential 1-dimensional line scans is developed. This procedure is applied a variety of phenomena including resonance excitations in superconducting resonators and DC transport measurements in proximitized semiconducting nanowires. The adaptive procedure shows improvement over standard equidistant measurements, but performance falls off as the amount of features and noise in the functions to measure increase. Using a more advanced theoretical framework, an early stage of an adaptive measurement procedure that automatically reduces noise when appropriate is also discussed.