MA
M. Albani
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1
The most recent developments of an efficient Iterative Physical Optics (IPO) algorithm for analyzing the electromagnetic scattering of complex and electrically large scenarios are presented. The algorithm predicts multiple interactions between the objects comprised in the scenarios under the Physical Optics (PO) approximation. Various techniques for accelerating and parallelizing the algorithm have been used, thus obtaining an efficient tool that can be used to realize a novel class of high-frequency solvers.
...
The most recent developments of an efficient Iterative Physical Optics (IPO) algorithm for analyzing the electromagnetic scattering of complex and electrically large scenarios are presented. The algorithm predicts multiple interactions between the objects comprised in the scenarios under the Physical Optics (PO) approximation. Various techniques for accelerating and parallelizing the algorithm have been used, thus obtaining an efficient tool that can be used to realize a novel class of high-frequency solvers.
Frequency and time domain UTD vertex diffraction
A heuristic solution and a step toward the exact one
The diffraction by vertexes or corners is important in practical engineering applications when it is necessary to characterize the scattering of objects with arbitrary shapes and finite dimensions. In this paper we discuss some of the existing Uniform Theory of Diffraction (UTD) solutions present in the literature. We will focus our attention on frequency domain heuristic solutions, which is then also extended in the time domain. Finally, we will discuss about the possibility of developing novel hybrid numerical-asymptotic solutions which can improve the existing ones.
...
The diffraction by vertexes or corners is important in practical engineering applications when it is necessary to characterize the scattering of objects with arbitrary shapes and finite dimensions. In this paper we discuss some of the existing Uniform Theory of Diffraction (UTD) solutions present in the literature. We will focus our attention on frequency domain heuristic solutions, which is then also extended in the time domain. Finally, we will discuss about the possibility of developing novel hybrid numerical-asymptotic solutions which can improve the existing ones.
Journal article
(2016)
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L Gagliano, A. Belabbes, M Albani, S. Assali, M. A. Verheijen, L Miglio, F. Bechstedt, J. E.M. Haverkort, E. P.A.M. Bakkers
Thanks to their uniqueness, nanowires allow the realization of novel semiconductor crystal structures with yet unexplored properties, which can be key to overcome current technological limits. Here we develop the growth of wurtzite GaP/InxGa1-xP core-shell nanowires with tunable indium concentration and optical emission in the visible region from 590 nm (2.1 eV) to 760 nm (1.6 eV). We demonstrate a pseudodirect (δ8c-δ9v) to direct (δ7c-δ9v) transition crossover through experimental and theoretical approach. Time resolved and temperature dependent photoluminescence measurements were used, which led to the observation of a steep change in carrier lifetime and temperature dependence by respectively one and 3 orders of magnitude in the range 0.28 ± 0.04 ≤ x ≤ 0.41 ± 0.04. Our work reveals the electronic properties of wurtzite InxGa1-xP.
...
Thanks to their uniqueness, nanowires allow the realization of novel semiconductor crystal structures with yet unexplored properties, which can be key to overcome current technological limits. Here we develop the growth of wurtzite GaP/InxGa1-xP core-shell nanowires with tunable indium concentration and optical emission in the visible region from 590 nm (2.1 eV) to 760 nm (1.6 eV). We demonstrate a pseudodirect (δ8c-δ9v) to direct (δ7c-δ9v) transition crossover through experimental and theoretical approach. Time resolved and temperature dependent photoluminescence measurements were used, which led to the observation of a steep change in carrier lifetime and temperature dependence by respectively one and 3 orders of magnitude in the range 0.28 ± 0.04 ≤ x ≤ 0.41 ± 0.04. Our work reveals the electronic properties of wurtzite InxGa1-xP.
We propose an array of connected leaky-wave slots as feed of an extended hemispherical dielectric lens, for broadband
imaging applications. Simulations of the entire structure, including array and lens, are performed by combining a spectral
Green’s function approach and an accelerated physical optics method. The antenna characteristics are investigated over a 4:1
bandwidth parametrically varying the feed off-axis distance (x/R, y/R) and the lens extension length (L). Measurements from
prototype demonstrator are also presented to validate the method of analysis. ...
imaging applications. Simulations of the entire structure, including array and lens, are performed by combining a spectral
Green’s function approach and an accelerated physical optics method. The antenna characteristics are investigated over a 4:1
bandwidth parametrically varying the feed off-axis distance (x/R, y/R) and the lens extension length (L). Measurements from
prototype demonstrator are also presented to validate the method of analysis. ...
We propose an array of connected leaky-wave slots as feed of an extended hemispherical dielectric lens, for broadband
imaging applications. Simulations of the entire structure, including array and lens, are performed by combining a spectral
Green’s function approach and an accelerated physical optics method. The antenna characteristics are investigated over a 4:1
bandwidth parametrically varying the feed off-axis distance (x/R, y/R) and the lens extension length (L). Measurements from
prototype demonstrator are also presented to validate the method of analysis.
imaging applications. Simulations of the entire structure, including array and lens, are performed by combining a spectral
Green’s function approach and an accelerated physical optics method. The antenna characteristics are investigated over a 4:1
bandwidth parametrically varying the feed off-axis distance (x/R, y/R) and the lens extension length (L). Measurements from
prototype demonstrator are also presented to validate the method of analysis.