G. Fiorentino
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3 records found
1
The measurement of the power dissipated by a semiconductor device is essential to evaluate the performance and reliability of power electronics systems. Power loss measurement can be difficult when the device is highly efficient and the losses are extremely low. When measuring the efficiency of an electronic system, many kind of errors can be introduced by the probes or by instruments and therefore the use of bulky and expensive set-ups are often required. The paper presents a simple method based on a heat flux measurement sensor that allows the estimation by calorimetry of the power dissipated by a semiconductor device. A control/readout circuit keeps the switching device at room temperature minimizing the heat exchanged with the ambient, improving the accuracy of the measurement.
thin dielectric with these metallic inclusions, an engineered slab with effectively quarter wavelength thickness has been realized.
Despite the large effective height and density of the artificial dielectric, the surface wave efficiency of the antenna is 99%. This
is entirely due to the anisotropic properties of the material. A prototype antenna was built using an in-house CMOS back-end compatible integrated circuits (IC) process. Measured results from the antenna are presented and show a good agreement with the expected results. ...
thin dielectric with these metallic inclusions, an engineered slab with effectively quarter wavelength thickness has been realized.
Despite the large effective height and density of the artificial dielectric, the surface wave efficiency of the antenna is 99%. This
is entirely due to the anisotropic properties of the material. A prototype antenna was built using an in-house CMOS back-end compatible integrated circuits (IC) process. Measured results from the antenna are presented and show a good agreement with the expected results.