EK

Ernst Kozeschnik

Authored

1 records found

Analysis of SN-BI solders

X-ray micro computed tomography imaging and microstructure characterization in relation to properties and liquid phase healing potential

This work provides an analysis of X-ray micro computed tomography data of Sn-xBi solders with x = 20, 30, 35, 47, 58 wt.% Bi. The eutectic thickness, fraction of eutectic and primary phase are analyzed. Furthermore, the 3D data is evaluated by means of morphology parameters, such ...