EK
E. Kramer
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7 records found
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Natural materials such as wood exhibit high mechanical properties through cellulose structured at multiple length scales and embedded in a matrix of similar chemical structure. These hierarchical materials have inspired the design of lightweight composites composed of naturally o
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Particle defects are important contributors to yield loss in semi-conductor manufacturing. Particles need to be detected and characterized in order to determine and eliminate their root cause. We have conceived a process flow for advanced defect classification (ADC) that distingu
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