EK

E. Kramer

Authored

2 records found

Particle defects are important contributors to yield loss in semi-conductor manufacturing. Particles need to be detected and characterized in order to determine and eliminate their root cause. We have conceived a process flow for advanced defect classification (ADC) that distingu ...
Natural materials such as wood exhibit high mechanical properties through cellulose structured at multiple length scales and embedded in a matrix of similar chemical structure. These hierarchical materials have inspired the design of lightweight composites composed of naturally o ...