Mv

Maarten van Es

2 records found

Authored

We have developed a high speed, miniature scanning probe microscope (MSPM) integrated with a Positioning Unit (PU) for accurately positioning the MSPM on a large substrate. This combination enables simultaneous, parallel operation of many units on a large sample for high throughp ...

Contributed

Enhancing AFM

Speeding up an AFM measurement by altering the Q factor

The Atomic Force Microscope (afm) is a small scale measuring device, with a lot of benefits over other existing measuring techniques. Unfortunately, measurement speed is not one of them. Many have tried and succeeded to improve the measurement speed, but there is still room for i ...