In this study the role of anisotropy on flux penetration in c-axis epitaxial Tl2⁢Ba2⁢CuO6+𝑥 and YBa2⁢Cu3⁢O7−𝑥 films is investigated by magneto-optics. We study thin films of Tl2⁢Ba2⁢CuO6+𝑥 on substrates with vicinal angles of 0° (well-oriented), 0.5°, 2.5°, and 4° and YBa2⁢Cu3⁢O7−𝑥 films as a function of chain-conduction-induced anisotropy. A crossover from fractal to nonfractal flux penetration is observed with increasing anisotropy. Numerical simulations of anisotropic flux motion are compared with experiment.