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Alirad Malek

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3 records found

Journal article (2016) - Ioannis Sourdis, Danish Anis Khan, Alirad Malek, Stavros Tzilis, Georgios Smaragdos, Christos Strydis
This article presents a chip multiprocessor (CMP) design that mixes coarse- and fine-grained reconfigurability to increase core availability of safety-critical embedded systems in the presence of hard errors. The authors conducted a comprehensive design-space exploration to identify the granularity mixes that maximize CMP fault tolerance and minimize performance and energy overheads. The authors added fine-grained reconfigurable logic to a coarse-grained sparing approach. Their resulting design can tolerate 3 times more hard errors than core redundancy and 1.5 times more than any other purely coarse-grained solution. ...
Conference paper (2014) - A. Malek, S. Tzilis, D. A. Khan, I. Sourdis, G. Smaragdos, C. Strydis
Reconfigurable hardware can be employed to tolerate permanent faults. Hardware components comprising a System-on-Chip can be partitioned into a handful of substitutable units interconnected with reconfigurable wires to allow isolation and replacement of faulty parts. This paper offers a probabilistic analysis of reconfigurable designs estimating for different fault densities the average number of fault-free components that can be constructed as well as the probability to guarantee a particular availability of components. Considering the area overheads of reconfigurability, we evaluate the resilience of various reconfigurable designs with different granularities. Based on this analysis, we conduct a comprehensive design-space exploration to identify the granularity mixes that maximize the fault-tolerance of a system. Our findings reveal that mixing fine-grain logic with a coarse-grain sparing approach tolerates up to 3× more permanent faults than component redundancy and 2× more than any other purely coarse-grain solution. Component redundancy is preferable at low fault densities, while coarse-grain and mixed-grain reconfigurability maximize availability at medium and high fault densities, respectively. ...
Conference paper (2014) - Georgios Smaragdos, Danish Anis Khan, Ioannis Sourdis, Christos Strydis, Alirad Malek, Stavros Tzilis
Recent trends in semiconductor technology have dictated the constant reduction of device size. One negative effect stemming from the reduction in size and increased complexity is the reduced device reliability. This paper is centered around the matter of permanent fault tolerance and graceful system degradation in the presence of permanent faults. We take advantage of the natural redundancy of homogeneous multicores following a sparing strategy to reuse functional pipeline stages of faulty cores. This is done by incorporating reconfigurable interconnects next to which the cores of the system are placed, providing the flexibility to redirect the data-flow from the faulty pipeline stages of damaged cores to spare (still) functional ones. Several micro-architectural changes are introduced to decouple the processor stages and allow them to be interchangeable. The proposed approach is a clear departure from previous ones by offering full flexibility as well as highly graceful performance degradation at reasonable costs. More specifically, our coarsegrain faulttolerant multicore array provides up to ×4 better availability compared to a conventional multicore and up to ×2 higher probability to deliver at least one functioning core in high fault densities. For our benchmarks, our design (synthesized for STM 65nm SP technology) incurs a total execution-time overhead for the complete system ranging from ×1.37 to ×3.3 compared to a (baseline) non-fault-tolerant system, depending on the permanent-fault density. The area overhead is 19.5% and the energy consumption, without incorporating any power/energy- saving technique, is estimated on average to be 20.9% higher compared to the baseline, unprotected design. ...