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Wu, L. (author), Rao, Siddharth (author), Taouil, M. (author), Marinissen, Erik Jan (author), Kar, Gouri Sankar (author), Hamdioui, S. (author)
The manufacturing process of STT-MRAM requires unique steps to fabricate and integrate magnetic tunnel junction (MTJ) devices which are data-storing elements. Thus, understanding the defects in MTJs and their faulty behaviors are paramount for developing high-quality test solutions. This article applies the advanced device-aware test to...
journal article 2022
Source URL (retrieved on 2024-06-12 09:16): https://repository.tudelft.nl/islandora/search/subject%3A%22Circuit%255C%20faults%22?f%5B0%5D=mods_name_personal_author_namePart_family_ss%3A%22Taouil%22