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document
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Aouichi, A. (author), Yuan, S. (author), Fieback, M. (author), Rao, Siddharth (author), Kim, Woojin (author), Marinissen, Erik Jan (author), Couet, Sebastien (author), Taouil, M. (author), Hamdioui, S. (author)
Spin-Transfer Torque Magnetic RAMs (STT-MRAMs) are on their way to commercialization. However, obtaining high-quality test and diagnosis solutions for STT-MRAMs is challenging due to the existence of unique defects in Magnetic Tunneling Junctions (MTJs). Recently, the Device-Aware Test (DA-Test) method has been put forward as an effective...
conference paper 2023
Source URL (retrieved on 2024-06-12 23:46): https://repository.tudelft.nl/islandora/search/subject%3A%22Testing%22?f%5B0%5D=mods_name_personal_author_namePart_family_ss%3A%22Taouil%22&f%5B1%5D=mods_subject_topic_ss%3A%22unique%5C%20defect%22&f%5B2%5D=mods_name_personal_author_namePart_family_ss%3A%22Fieback%22